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  JEDEC, a standardization organization in the semiconductor industry, develops industrial standards in solid state electronics (semiconductor, memory), established for more than 50 years, is a global organization. The standards it has formulated are many industries take over and adopt. It's technical data are open and free of charge, only some of the data need to be charged. So you can go to the official website to register and download, the content contains the definition of professional terms, product specifications, test methods, reliability test requirements... It covers a wide range of topics. JEDEC specification query and download website: https://www.jedec.org/ JEP122G-2011 Failure mechanism and model of semiconductor components Accelerated life tests are used to identify potential semiconductor failure causes in advance and estimate possible failure rates. The relevant activation energy and acceleration factor formulas are provided in this section for estimation and failur...

  Temperature Cycle Test Specification Instructions In order to simulating the temperature conditions encountered by different electronic components in the actual use environment, T emperature Cycling  changes the ambient temperature difference range and rapid rise and fall temperature change to provide a more stringent test environment. However, it must be noted that additional effects may be caused to material testing. For the relevant international standard test conditions of  temperature cycle test , there are two ways to set the temperature change. First, Lab Companion provides an intuitive setting interface, which is convenient for users to set according to the specification. Second, you can choose the total Ramp time or set the rising and cooling rate with the temperature change rate per minute. List of International Specifications for Temperature Cycling Tests: Total Ramp time (min) : JESD22-A104, MIL-STD-8831, CR200315 Temperature variation per minute (℃/min) IEC...